CVE List

Open Dataset
Creators:
CVE
Publication Date:
2024
Data Category:
Dataset Description:
The mission of the CVE® Program is to identify, define, and catalog publicly disclosed cybersecurity vulnerabilities identified from 1999 through June 25, 2024, providing a historical perspective on the evolution of cybersecurity threats over a span of 25 years. Its primary purpose is to standardize the identification of vulnerabilities across various platforms and security tools, facilitating consistent and efficient communication within the cybersecurity community. As of June 25, 2024, the CVE List comprises 269,759 records with a size of 36,3 kB.

Each CVE entry includes several key components:​

  • CVE Identifier (CVE ID): A unique alphanumeric code assigned to each vulnerability, following the format "CVE-YYYY-NNNN," where "YYYY" denotes the year of identification, and "NNNN" is a sequential number.​

  • Description: A brief summary outlining the nature of the vulnerability, including affected software or hardware, potential impacts, and any known exploits.​

  • References: Links to external resources such as security advisories, vendor bulletins, or detailed analyses that provide additional context or mitigation information.

Publications Citing This Dataset:
V. Mounika, X. Yuan and K. Bandaru. (2019).Analyzing CVE Database Using Unsupervised Topic Modelling. International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA, 2019, pp. 72-77.
doi: 10.1109/CSCI49370.2019.00019.
Blinowski, G.J., Piotrowski, P. (2020). CVE Based Classification of Vulnerable IoT Systems. In: Zamojski, W., Mazurkiewicz, J., Sugier, J., Walkowiak, T., Kacprzyk, J. (eds) Theory and Applications of Dependable Computer Systems. DepCoS-RELCOMEX 2020. Advances in Intelligent Systems and Computing, vol 1173. Springer, Cham.
https://doi.org/10.1007/978-3-030-48256-5_9
S. Neuhaus and T. Zimmermann, "Security Trend Analysis with CVE Topic Models," 2010 IEEE 21st International Symposium on Software Reliability Engineering, San Jose, CA, USA, 2010, pp. 111-120
doi: 10.1109/ISSRE.2010.53
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